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- Accession Number
- WOS:000336495200001
- Authors
- K. Zhang, M. Nafría, M. Porti, S. M. Hou, Q. Fu, Z. Y. Shen, y M. Lanza
- Citation Key
- 405
- COinS Data
- Date Published
- 2014
- DOI
- 10.1080/10584587.2014.902280
- ISBN Number
- 1607-8489
- ISSN
- 1058-4587
- Keywords
- BREAKDOWN, CAFM, ELECTRICAL CHARACTERIZATION, GATE STACKS, high-K materials, OXIDES, THIN, TIPS
- Issue
- 1
- Pagination
- 1-8
- Journal
- INTEGRATED FERROELECTRICS
- Start Page
- 1
- Type of Article
- Article
- URL
- http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=T2RNqQwde7r4jL3OUYv&page=2&doc=11
- Volume
- 153
- Year of Publication
- 2014