Accession Number
WOS:000336495200001
Authors
K. Zhang, M. Nafría, M. Porti, S. M. Hou, Q. Fu, Z. Y. Shen, y M. Lanza
Citation Key
405
COinS Data

Date Published
2014
DOI
10.1080/10584587.2014.902280
ISBN Number
1607-8489
ISSN
1058-4587
Keywords
BREAKDOWN, CAFM, ELECTRICAL CHARACTERIZATION, GATE STACKS, high-K materials, OXIDES, THIN, TIPS
Issue
1
Pagination
1-8
Journal
INTEGRATED FERROELECTRICS
Start Page
1
Type of Article
Article
URL
http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=T2RNqQwde7r4jL3OUYv&page=2&doc=11
Volume
153
Year of Publication
2014