Accession Number
10545622
Authors
J. Martín-Martínez, G. Groeseneken, B. Dierickx, P. Zuber, X. Aymerich, M. Nafría, R. Rodríguez, N. Ayala, J. Boix, y B. Kaczer
Citation Key
357
COinS Data

DOI
10.1109/SCED.2009.4800454
ISBN Number
978-1-4244-2838-0
ISBN
978-1-4244-2839-7
Keywords
bias temperature instability, capacitors, circuit simulation, circuit-design oriented modelling, inverters, mirror, MOSFET aging, MOSFET circuits, post-BD gate currents, reliability, semiconductor device relibaility, stress, temperature dependence, thresh
Pagination
156-159
Conference Location
Santiago de Compostela
Conference Name
2009 Spanish Conference on Electron Devices
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4800454
Year of Conference
2009