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- Accession Number
- 12571581
- Authors
- J. Martín-Martínez, G. Groeseneken, B. Dierickx, X. Aymerich, M. Nafría, R. Rodríguez, P. J. Roussel, R. Degraeve, y B. Kaczer
- Citation Key
- 362
- COinS Data
- Date Published
- March 2012
- DOI
- 10.1109/TDMR.2011.2162238
- ISSN
- 1530-4388
- Keywords
- BD mechanisms, circuit design-oriented stochastic piecewise modeling, circuit simulation tools, CMOS, device geometries, device level characterization, Dielectric Breakdown, integrated circuit modeling, logic gates, model parameter extraction, MOSFET, MOS
- Issue
- 1
- Pagination
- 78-85
- Journal
- IEEE Transactions on Device and Materials Reliability
- Start Page
- 78
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5955107&sortType%3Ddesc_p_Publication_Year%26queryText%3DMartin-Martinez
- Volume
- 12
- Year of Publication
- 2012