Saltar al contenido
- Accession Number
- WOS:000314672300026
- Authors
- E. Amat, G. Groeseneken, R. Degraeve, X. Aymerich, M. Nafría, R. Rodríguez, y T. Kauerauf
- Citation Key
- 414
- COinS Data
- Date Published
- MAR 2013
- DOI
- 10.1016/j.mee.2012.10.011
- ISSN
- 0167-9317
- Keywords
- BTI, CMOS, ENERGY, GATE STACKS, high-k, Hot-carriers, MECHANISMS, reliability, stress, transistors
- Pagination
- 144-149
- Journal
- Microelectronics Reliability
- Start Page
- 144
- Type of Article
- Article
- URL
- http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=R2MgRVtjG5XTWRwBNXJ&page=3&doc=22
- Volume
- 103
- Year of Publication
- 2013