Authors R. Fernández, G. Groeseneken, B. Kaczer, X. Aymerich, M. Nafría, y R. Rodríguez Citation Key 217 COinS Data Date Published 2006 Pagination 1608-1611 Journal Microelectronics Reliability Volume 46 Year of Publication 2006 ← Performance and reliability of ultrathin oxide nMOSFETs under variable body bias → AC NBTI studied in the 1 Hz – 2 GHz range on dedicated on-chip CMOS circuits