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- Authors
- Q. Wu, E. Simoen, X. Aymerich, M. Nafría, R. Rodríguez, J. Martín-Martínez, M. Lanza, A. Bayerl, y M. Porti
- Citation Key
- 391
- COinS Data
- Date Published
- Feb 2015
- DOI
- 10.1109/CDE.2015.7087505
- ISBN Number
- 15060336
- Keywords
- CAFM, channel hot carrier stress, CHC stress, conductive atomic force microscope, gate dielectric, MOSFET, nanoscale electrical properties, NBTI stress, negative bias temperature instability stress, nonstrained MOSFET
- Conference Location
- Madrid
- Publisher
- IEEE
- Conference Name
- Electron Device Spanish Conference (CDE)
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7087505&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
- Year of Publication
- 2015