- Authors
- M. Lanza, G. Jaschke, H. Ranzinger, E. Lodermeier, W. Frammelsberger, G. Benstetter, M. Nafría, y M. Porti
- Citation Key
- 215
- COinS Data
- Date Published
- 2007
- Pagination
- 1424-1428
- Journal
- Microelectronics Reliability
- Volume
- 47
- Year of Publication
- 2007