Authors
A. Crespo-Yepes, F. Campabadal, M B González, X. Aymerich, M. Nafría, R. Rodríguez, M. Maestro, I. Rama, y J. Martín-Martínez
Citation Key
416
COinS Data

Date Published
January 2016
DOI
10.1109/ULIS.2016.7440058
ISBN Number
15886476
Keywords
Analytical models, circuit-based model, computational modeling, electrical models, fitting, integrated circuit modeling, inter device variability, model parameter distributions, nonvolatile memories, resistive RAM, Resistive Switching devices, RS array an
Conference Location
Vienna, Austria
Publisher
IEEE
Conference Name
EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7440058&queryText=crespo-yepes&sortType=desc_p_Publication_Year
Year of Publication
2016