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- Accession Number
- WOS:000343838200023
- Authors
- M. Moras, E. Simoen, X. Aymerich, M. Nafría, R. Rodríguez, y J. Martín-Martínez
- Citation Key
- 403
- COinS Data
- Date Published
- NOV 2014
- DOI
- 10.1016/j.sse.2014.06.036
- ISBN Number
- 1879-2405
- ISSN
- 0038-1101
- Keywords
- Annealing, BTI, Defect passivation, Emission and capture times, MOSFET, Time-dependent variability
- Pagination
- 131-136
- Journal
- SOLID-STATES ELECTRONICS
- Start Page
- 131
- Type of Article
- Article
- URL
- http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=T2RNqQwde7r4jL3OUYv&page=1&doc=5
- Volume
- 101
- Year of Publication
- 2014