Saltar al contenido
- Authors
- M. Maestro, X. Aymerich, F. Campabadal, M. Nafría, R. Rodríguez, J. Martín-Martínez, M B González, A. Crespo-Yepes, y J. Díaz
- Citation Key
- 390
- COinS Data
- Date Published
- Jan 2015
- DOI
- 10.1109/ULIS.2015.7063791
- ISBN Number
- 14999164
- Keywords
- characterization method measurement time resolution, high resolution random telegraph noise, Integrated circuit reliability, resistive RAM, Resistive Switching resolution, RRAM, RTN measurement procedure, weighted time lag method
- Conference Location
- Bologna
- Publisher
- IEEE
- Conference Name
- Ultimate Investigation on Silicon joint International EUROSOI (EUROSOI-ULIS)
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7063791&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
- Year of Publication
- 2015