Authors
J. Martín-Martínez, X. Aymerich, M. Nafría, R. Rodríguez, y J. Díaz
Citation Key
395
COinS Data

Date Published
13 March 2014
DOI
10.1109/LED.2014.2304673
ISBN Number
14181345
ISSN
0741-3106
Keywords
characterization, CMOS, Monte Carlo generated RTS traces, Monte Carlo methods, MOSFET, random noise, random telegraph noise, random telegraph signals, semicondcutor device noise, transistors, weighted time lag method
Issue
4
Pagination
479-481
Journal
IEEE Electron Device Letters
Start Page
479
Type of Article
Article
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6766663&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
Volume
35
Year of Publication
2014