Authors M.Lanza, X.Aymerich, M.Nafria, M.Porti, y V.Iglesias Citation Key 153 COinS Data Journal Nanoresearch letters (NRL) accepted Year of Publication 2011 ← Conductivity and charge trapping after electrical stress in amorphous and polycristaline Al2O3 based devices studied with AFM related techniques → Dielectric BD in polycristalline HfO2 gate dielectrics investigated by CAFM