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- Authors
- E. Amat, E. Simoen, P. Verheyen, X. Aymerich, M. Nafría, R. Rodríguez, M B González, y J. Martín-Martínez
- Citation Key
- 365
- COinS Data
- Date Published
- January 2011
- DOI
- 10.1116/1.3523396
- ISSN
- 1071-1023
- Keywords
- channel hot carriers, CHC, circuit reliability predictions, CMOS technology, elemental semiconductors, Ge-Si alloys, MOSFET, reliability, Silicon
- Issue
- 1
- Pagination
- 01AB07-01AB07-4
- Journal
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Start Page
- 01AB07
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5700618&sortType%3Ddesc_p_Publication_Year%26queryText%3DMartin-Martinez
- Volume
- 29
- Year of Publication
- 2011