Accession Number
13101521
Authors
J. Martín-Martínez, X. Aymerich, M. Nafría, R. Rodríguez, y N. Ayala
Citation Key
360
COinS Data

DOI
10.1109/SMACD.2012.6339386
ISBN Number
978-1-4673-0685-0
Keywords
Bias Temperature Instabilites, BTI, degradation phenomena, Integrated circuit reliability, MOSFET, physical models, RELAB capabilities, RELAB tool, semiconductor device reliability, simulation tools, simulator, SPICE, stress, transistors, variability
Pagination
249-252
Conference Location
Sevilla, Spain
Conference Name
2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6339386
Year of Conference
2012