- Authors
- A. Crespo-Yepes, M. Nafría, R. Rodríguez, X. Aragones, D. Mateo, J. Martín-Martínez, y E. Barajas
- Citation Key
- 433
- COinS Data
- Date Published
- 25 June 2017
- DOI
- 10.1016/j.mee.2017.05.021
- Keywords
- aging, CMOS, degradation, MOSFET, RF power amplifier, RF stress
- Pagination
- 289-292
- Journal
- Microelectronics Engineering
- Start Page
- 289
- Type of Article
- Journal
- URL
- http://www.sciencedirect.com/science/article/pii/S0167931717302186?via%3Dihub
- Volume
- 178
- Year of Publication
- 2017