Authors
M. Lanza, A. Sebastiani, G. Ghidini, X. Aymerich, M. Nafría, y M. Porti
Citation Key
306
COinS Data

Date Published
SEP-NOV 2009
DOI
10.1016/j.microrel.2009.06.016
ISBN Number
504JG
ISSN
0026-2714
Keywords
C-AFM; THIN
Issue
9-11
Pagination
1188-1191
Journal
Microelectronics Reliability
Start Page
1188
Type of Article
Article; Proceedings Paper
URL
http://www.sciencedirect.com/science/article/pii/S0026271409002182
Volume
49
Year of Publication
2009