Authors R. Rodríguez, X. Aymerich, J. Suñé, y M. Nafría Citation Key 273 COinS Data Date Published 1998 Issue 4 Pagination 881-888 Journal IEEE Transactions on Electron Devices Volume 45 Year of Publication 1998 ← Soft breakdown fluctuation events in ultra-thin SiO2 layers → Two-step stress method for the dynamic testing of very thin (8nm) SiO2 films