Authors M. Lanza, B. Hamilton, E. Whittaker, X. Aymerich, M. Nafría, y M. Porti Citation Key 159 COinS Data Date Published 2010 Pagination 1312-1315 Journal Microelectronics Reliability Volume 50 (9-11) Year of Publication 2010 ← SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors → Electrical resolution during Conductive AFM measurements under different environmental conditions and contact forces