During the last years we have worked in different methods of metrology.

We have proposed a point diffraction interferometer in which the phase stepping can be implemented by the use of liquid crystals.

We have proposed different numerical methods to obtain the profile of a surface from the data obtained with an optical deflectometer or a wave front sensor.

Different types of deflectometer geometries have been studied.

These methods are being implemented in commercial set-ups. In collaboration with the ALBA synchrotron that is being built in Barcelona we are developing new methods to measure the shape of X-ray mirrors with ultra-precision.